Optimal Linear Codes for Inner Product Masking
Poster, Journée de l’ED IP Paris 2019 (Welcoming Day of the PhD students of IP Paris Doctoral school), Paris, France
Citation: Wei Cheng, Olivier Rioul, Jean-Luc Danger and Sylvain Guilley. Optimal Linear Codes for Inner Product Masking. Journée de l’ED IP Paris 2019, Paris, France, Dec. 10, 2019. [Poster]